NI Brings Semiconductor ATE Digital Capabilities to PXI Platform

NI (National Instruments, National Instruments, NI) as a platform system vendor committed to helping engineers and scientists meet the world's most serious engineering challenges, today announced the NI PXle-6570 graphics vector based digital channel board and NI Digital Graphics Vector Editor. The product frees manufacturers of RF integrated circuits, power management ICs, microelectromechanical (MEMS) system devices, and mixed-signal ICs from the closed architecture of traditional semiconductor automated test equipment (ATE).

Traditional ATE test coverage often fails to meet the latest semiconductor device requirements. By introducing the semiconductor industry's mature digital test mode into the semiconductor test system (STS) based on the PXI open platform, and using a powerful and user-friendly editor and debugger to optimize, users can use advanced PXI instruments to reduce radio frequency. And simulate IC test costs and improve throughput.

"PXI digital-mode instrumentation provides semiconductor engineers with the digital capabilities found in all high-end digital test platforms, so it is undoubtedly an addition to STS," said Ron Wolfe, vice president of semiconductor testing at NI. "If PXI in the production hall has this capability, They can easily extend the test to other products while meeting the cost and test requirements of advanced devices."

The NI PXIe-6570 digital-mode instrument provides the necessary test capabilities for wireless device supply chain and IoT device common ICs at a very affordable price. It features a graphic vector execution rate of 100 MVector/sec with independent source, capture engine, voltage/current parametric functions, and up to 256 simultaneous digital pins in a single subsystem. Users can take full advantage of PXI's openness and STS to randomly increase or decrease the number of devices required to meet the device pin and test points required for the test configuration.

The new digital pattern editor software has the following features: device pin map, specification and graphic vector editing environment to help develop test plans more quickly; various built-in tools such as multi-site and multi-instrument parallel transceiving implement products Seamless docking from development to production; tools such as shmoo diagrams and interactive pin views enable more efficient debugging and optimization testing.

Using the same PXI hardware, TestStand, LabVIEW, and digital pattern editor software for feature analysis and product testing can reduce the amount of work required for data correlation and shorten time-to-market. The PXI hardware inside and outside of the STS configuration has a small footprint, which saves plant space and can be powered using standard wall plug-in power supplies on the feature analysis lab bench.

"PXI has proven to be an outstanding hardware and software integration solution that can be applied to both the line shop and the feature analysis lab," Wolfe added. "NI's graphics vector based digital channel board and digital graphic vector editor are Key innovations that help device manufacturers and test houses reduce test costs and optimize test program development."

Many semiconductor companies are building intelligent test systems based on the NI platform and ecosystem. It is not just the production of the applicable STS series, 1 GHz bandwidth vector signal transceivers, fA-level source measurement units and TestStand semiconductor modules that benefit from more than 600 PXI products covering DC to millimeter waves. They use the PCI Express third-generation bus interface, which has high throughput data transmission capability, sub-nanosecond synchronization, and integrated timing and triggering. Users can take advantage of the productivity productivity of LabVIEW and TestStand software environments, as well as an active ecosystem of partners, additional IP, and application engineer teams, dramatically reducing test costs, shortening time-to-market, and developing future-proof test equipment to meet future RF and Mixed signal testing challenges.

To learn more about NI's semiconductor test products, visit


About NI

Since 1976, National Instruments has been committed to providing a variety of powerful platform-based systems to help engineers and scientists improve efficiency and accelerate innovation to solve the major engineering challenges facing the world. Customers from industries such as healthcare, automotive, consumer electronics, and particle physics are using NI's integrated hardware and software platforms to improve the environment we live in.

Since its founding in 1998, NI China has continuously dedicated itself to providing local users with innovative, efficient tools and solutions based on the strength of multinational companies. The nationwide sales, technical personnel, and system alliances network are responsible for providing quality services to the local market and are dedicated to meeting customer requirements. The launch of NI China Online Mall has further improved NI's service system, aiming to provide users with a more convenient and quick buying experience. Now browse: china.ni.com/howtobuy



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